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Lifetime spectroscopy: a method of defect characterization in silicon for photovoltaic applications

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Author:
Rein, S. (Stefan)
Series:
Springer series in materials science volume 85
Publisher:
Springer
Pub. Date:
©2005
Language:
English
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Contributors:
SpringerLink (Online Service)
ISBN:
9781615833818
9786610308446
9783540279228
9783540253037
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Grouping Information

Grouped Work ID8061b150-1b2f-dfd3-9376-3d1f5849c433
Grouping Titlelifetime spectroscopy a method of defect characterization in silicon for photovoltaic applications
Grouping Authors rein
Grouping Categorybook
Grouping LanguageEnglish (eng)
Last Grouping Update2024-05-01 10:20:34AM
Last Indexed2024-05-02 23:11:48PM

Solr Fields

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author
Rein, S. (Stefan)
author2-role
SpringerLink (Online Service)
author_display
Rein, S.
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CCU Electronic Resources
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CCU Electronic Resources
primary_isbn
9781615833818
publishDate
2005
publisher
Springer
recordtype
grouped_work
series
Springer series in materials science
series_with_volume
Springer series in materials science|85
subject_facet
Physique
Semi-conducteurs -- Défauts
Semiconductors -- Defects
Semoconductors -- Defects
Silicium cristallisé -- Défauts
Silicium cristallisé -- Spectre
Silicon crystals -- Defects
Silicon crystals -- Spectra
title_display
Lifetime spectroscopy : a method of defect characterization in silicon for photovoltaic applications
title_full
Lifetime spectroscopy : a method of defect characterization in silicon for photovoltaic applications / S. Rein
title_short
Lifetime spectroscopy
title_sub
a method of defect characterization in silicon for photovoltaic applications
topic_facet
Defects
Défauts
Physique
Semi-conducteurs
Semiconductors
Semoconductors
Silicium cristallisé
Silicon crystals
Spectra
Spectre

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external_econtent:ils:.b29625129eBookeBookEnglishSpringer©20051 online resource (xxvi, 489 pages) : illustrations (some color)

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