Lifetime spectroscopy: a method of defect characterization in silicon for photovoltaic applications

Book Cover
Publisher:
Springer,
Pub. Date:
[2005]
Language:
English
Description

Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. Since it is based on the recombination process, it provides insight into precisely those defects that are relevant to semiconductor devices such as solar cells. This book introduces a transparent modeling procedure that allows a detailed theoretical evaluation of the spectroscopic potential of the different lifetime spectroscopic techniques. The various theoretical predictions are verified experimentally with the context of a comprehensive study on different metal impurities. The quality and consistency of the spectroscopic results, as explained here, confirms the excellent performance of lifetime spectroscopy.

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ISBN:
9781615833818
9783540279228
9783540253037
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Grouped Work ID2f4fc34d-4d35-662b-bcc5-152b253b9579
Grouping Titlelifetime spectroscopy a method of defect characterization in silicon for photovoltaic applications
Grouping Authorrein s
Grouping Categorybook
Last Grouping Update2019-12-05 22:33:26PM
Last Indexed2019-12-07 03:21:13AM

Solr Details

accelerated_reader_point_value0
accelerated_reader_reading_level0
authorRein, S. (Stefan)
author2-roleSpringerLink (Online service)
author_displayRein, S
available_at_ccuCCU Electronic Resources
detailed_location_ccuCCU Electronic Resources
display_descriptionAnnotation
format_category_ccueBook
format_ccueBook
id2f4fc34d-4d35-662b-bcc5-152b253b9579
isbn9781615833818
9783540253037
9783540279228
item_details
Bib IdItem IdShelf LocCall NumFormatFormat CategoryNum CopiesIs Order ItemIs eContenteContent SourceeContent FileeContent URLsubformatDetailed StatusLast CheckinLocationSub-location
external_econtent:ils:.b29625129.i71774555CCU Electronic ResourceseBookeBook1falsetrueSpringerLink CCU Purchasehttp://ezproxy.ccu.edu/login?url=http://dx.doi.org/10.1007/3-540-27922-9CCU AccessAvailable Onlinecceb
itype_ccuE-book
last_indexed2019-12-07T10:21:13.089Z
lexile_score-1
literary_formNon Fiction
literary_form_fullNon Fiction
owning_library_ccuColorado Christian University Online
owning_location_ccuCCU Electronic Resources
primary_isbn9781615833818
publishDate2005
record_details
Bib IdFormatFormat CategoryEditionLanguagePublisherPublication DatePhysical Description
external_econtent:ils:.b29625129eBookeBookEnglishSpringer, [2005]1 online resource (xxvi, 489 pages) : illustrations (some color).
recordtypegrouped_work
scoping_details_ccu
Bib IdItem IdGrouped StatusStatusLocally OwnedAvailableHoldableBookableIn Library Use OnlyLibrary OwnedHoldable PTypesBookable PTypesLocal Url
external_econtent:ils:.b29625129.i71774555Available OnlineAvailable Onlinefalsetruefalsefalsefalsetrue
seriesSpringer series in materials science
series_with_volumeSpringer series in materials science|85
subject_facetElectronic books
Optical and Electronic Materials
Optical materials
Particles (Nuclear physics)
Physics
Physique
Semiconductors -- Defects
Semoconductors -- Defects
Silicon crystals -- Defects
Silicon crystals -- Spectra
Solid State Physics and Spectroscopy
title_displayLifetime spectroscopy : a method of defect characterization in silicon for photovoltaic applications
title_fullLifetime spectroscopy : a method of defect characterization in silicon for photovoltaic applications / S. Rein
title_shortLifetime spectroscopy
title_suba method of defect characterization in silicon for photovoltaic applications
topic_facetDefects
Optical and Electronic Materials
Optical materials
Particles (Nuclear physics)
Physics
Physique
Semiconductors
Semoconductors
Silicon crystals
Solid State Physics and Spectroscopy
Spectra